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Enhanced CsPbBr₃ X-ray detectors achieve record-low detection limits

Enhanced CsPbBr3 X-ray detectors achieve record-low detection limits
Comparison of X-ray imaging results for CsPbBr3 wafer-based X-ray detectors before and after grain boundary modification. Credit: Chen Ran

In a major step forward for radiation detection technology, a research team led by Prof. Meng Gang from the Hefei Institutes of 鶹Ժical Science of the Chinese Academy of Sciences has significantly enhanced the performance of CsPbBr3-based X-ray detectors by dramatically lowering their detection limit and suppressing noise and ion migration through innovative cooling and defect-passivation strategies.

Their work, published in and , lays the groundwork for the next generation of safer and more precise X-ray imaging technology.

One of the biggest challenges in utilizing CsPbBr3 for X-ray detectors has been minimizing noise and improving sensitivity.

To overcome this, the researchers applied a cooling technique to CsPbBr3 single crystals, effectively eliminating deep-level defects that typically introduce noise. This approach boosted the material's resistivity by two orders of magnitude and reduced the detection limit to 0.054 nGyair·-1, enabling the detection of extremely weak X-ray signals.

The team also addressed the issue of ion migration in polycrystalline CsPbBr3 wafers, which are more practical for large-scale applications.

In collaboration with Prof. Fang Xiaosheng's group from Fudan University, they developed a grain boundary passivation method that raised the ion migration activation energy to 0.56 eV. This significantly suppressed dark current drift under high electric fields, allowing the polycrystalline to reach a detection limit of 9.41 nGyair·-1 while maintaining excellent image contrast.

CsPbBr3 detectors could dramatically reduce the required for X-ray imaging, which is particularly important for vulnerable populations, such as children and pregnant women.

This advancement not only offers a clearer path toward next-generation X-ray detectors, but also accelerates the evolution of radiation imaging technology toward greater safety and precision.

More information: Xiao Zhao et al, Freezing non-radiative recombination in high-performance CsPbBr3 single crystal X-ray detector, Applied 鶹Ժics Letters (2024).

Xiao Zhao et al, 2‐Bromonaphthalene‐Induced Defect Passivation to Suppress Ion Migration in CsPbBr3 Wafer for X‐Ray Detector with Bias‐Resistant Stability, Advanced Functional Materials (2025).

Citation: Enhanced CsPbBr₃ X-ray detectors achieve record-low detection limits (2025, April 15) retrieved 16 June 2025 from /news/2025-04-cspbbr-ray-detectors-limits.html
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